구입 판매 및 기술문의 : 010-4221-0660
The Keysight 81160A (Agilent) Pulse Function Arbitrary Noise Generator is a high precision pulse generator enhanced with versatile signal generation, modulation and distortion capabilities that are integrated into one instrument to minimize cabling, space, and test time. It eliminates the need for cumbersome multi-instrument setups for stress testing devices. It provides versatile waveforms along with superior signals with an intrinsic jitter of 7 ps rms. This combination of characteristics helps engineers define better performance specifications for their devices. The Agilent 81160A Pulse Function Arbitrary Noise Generator is ideal for general-purpose bench tests and advanced serial data stress tests.Features and Specifications of the Keysight 81160A (Agilent) Pulse Function Arbitrary Noise Generator Include:
A high precision pulse generator:
- Enhanced with versatile signal generation, modulation and distortion capabilities for:
- Accurate signals to test your device to its limits and not your signal source
- Versatile waveform and noise generation to be ready for today‘s and tomorrow‘s stress test challenges
An arbitrary bit-shaped pattern generator:
- To test in addition to analog, digital and mixed signal devices
- For ideal and destorted pattern up to 600 Mbit/s
- Integrated into one instrument to minimize cabling, space and test time
- Precise signals for performance verification and characterization
A function arbitrary generator:
- Provides versitile waveforms and modulation capabilities to shape the signal the DUT needs
- For versatile signal generation to optimize testing
A noise generator:
- Combines two required extremes, random noise and repeatable noise with very long repetition rates for simple problem identification
- To distort signals to build up worst case scenarios
Generation of 330-MHz pulses and 500-MHz function/arbitrary waveforms with a 2.5-GSa/s sample rate and 14-bit vertical resolutionSelectable crest factors for white Gaussian noise lets engineers determine how much distortion to apply to a device during stress testing to meet various serial bus standardsGlitch-free timing parameter changes allow engineers to change the frequency without drop-outs or glitches and enable continuous operation without rebooting or resetting the device under testArbitrary bit patterns show capacitive load of the channels using simple pattern settingsComplex measurement setups are no longer necessary to test designs to their limitsPulses 330 MHz, 500 Mhz sine waves, 660 Mbit patternCan be used in many diffe applications including:
- Noise source for physical layer tests in communications and computer bus standards
- Clock generation
- System trigger source
- Radar test device testing
- Signal integrity test
- Noise and jitter emulation
- Ethernet
- SATA
- Nanotechnology
Enhanced with versatile signal generation, modulation and distortion capabilities for:
- Accurate signals to test your device to its limits and not your signal source
- Versatile waveform and noise generation to be ready for today‘s and tomorrow‘s stress test challenges
Accurate signals to test your device to its limits and not your signal sourceVersatile waveform and noise generation to be ready for today‘s and tomorrow‘s stress test challengesTo test in addition to analog, digital and mixed signal devicesFor ideal and destorted pattern up to 600 Mbit/sIntegrated into one instrument to minimize cabling, space and test timePrecise signals for performance verification and characterizationProvides versitile waveforms and modulation capabilities to shape the signal the DUT needsFor versatile signal generation to optimize testingCombines two required extremes, random noise and repeatable noise with very long repetition rates for simple problem identificationTo distort signals to build up worst case scenariosNoise source for physical layer tests in communications and computer bus standardsClock generationSystem trigger sourceRadar test device testingSignal integrity testNoise and jitter emulationEthernetSATANanotechnology
